HCAT
Product
AlN Wafer
AlN Raw Materials
Spare parts of AlN Semiconductor equipment
SiC Raw Materials
Spare parts of SiC Semiconductor equipment
Si3N4 Raw Materials
Spare parts of Si3N4 Semiconductor equipment
About HCAT
Introduction
Milestone
Patent
News
Contact us
English
繁體中文
繁
EN
SCROLL
Product
Product Portfolio
Spare parts of SiC Semiconductor equipment
Spare parts of SiC Semiconductor equipment
1
SiC Trays and Carriers
Product Features
Low on-state resistance
Ion resistance
High temperature and pressure resistance
Good thermal conductivity and stability
Easy to clean
Application
For the processes such as dry or wet etching and Mocvd.
2
SiC Edge-Ring
Product Features
Low on-state resistance
Ion resistance
High temperature and pressure resistance
Good thermal conductivity and stability
Easy to clean
Application
For the processes such as dry or wet etching and Mocvd.
3
SiC RTP H-Ring
Product Features
Low on-state resistance
Ion resistance
High temperature and pressure resistance
Good thermal conductivity and stability
Easy to clean
Application
For the processes such as dry or wet etching and Mocvd.
×
氮化鋁塊材規格表
(表格內容可透過左右拖移
)
Item / Unit
AlN
Block
Thickness
mm
2 ~ 30
Size
mm
<450
Color
-
Beige-Gray
Sape
-
Rotundity
Through
hole
mm
-
Bulk
density
g/cm3
3.4
Surface
roughness
µm
-
Mechanical
characteristic
3-point
bending strength
MPa
-
Young's
modulus
GPa
-
Vickers
hardness
GPa
-
Breakdown
Strength
kV/mm
-
Thermal
characteristic
Coefficient
of thermal expansion
40-400℃
×10-6/K
4.8
40-800℃
×10-6/K
5.4
Thermal
conductivity
25℃
W/(m・K)
170~190
Specific
heat
J/(kg・K)
720
Electric
characteristic
Dielectric constant
1MHz
-
9
Dielectric
Loss
1MHz
×10-4
3
Volume
resistivity
25℃
Ω・cm
>1014
×
Exposure Churk 規格表
(表格內容可透過左右拖移
)
Items
Normal
Temp. Sputtering
High
Temp. Sputtering
HCAT
Japanese
Manufacturers
USA
Manufacturers
TSV
Specification
Susceptor
material
Aluminum
Ceramics
Ceramics
Dimension
(mm)
Ø330*9
Ø330*9
Ø330*9
Input
Voltage(kV)
+/- 3
+/- 3
+/- 3
Operating
Temp.(℃)
25~80
150~350
50~350
Dielectric
Insulation (GΩ),RT
>1
>1
>1.2
Life-Time(hr)
>1000
>2000
>2000
Breakdown
voltage (KV/mm)
10
25
25
×
Pin Churk 規格表
(表格內容可透過左右拖移
)
Items
Normal
Temp. Sputtering
High
Temp. Sputtering
HCAT
Japanese
Manufacturers
USA
Manufacturers
TSV
Specification
Susceptor
material
Aluminum
Ceramics
Ceramics
Dimension
(mm)
Ø330*9
Ø330*9
Ø330*9
Input
Voltage(kV)
+/- 3
+/- 3
+/- 3
Operating
Temp.(℃)
25~80
150~350
50~350
Dielectric
Insulation (GΩ),RT
>1
>1
>1.2
Life-Time(hr)
>1000
>2000
>2000
Breakdown
voltage (KV/mm)
10
25
25
×
碳化矽塊材規格表
(表格內容可透過左右拖移
)
Item / Unit
SiC
Block
Thickness
µm
100 ~ 2000
100 ~ 2000
100 ~ 2000
Size
inch
Ф6"
Ф8"
Ф12"
Color
-
Carbon-black
Carbon-black
Carbon-black
Sape
-
Rotundity
Rotundity
Rotundity
Through
hole
mm
-
-
-
Bulk
density
g/cm3
3.2
3.2
3.2
Surface
roughness
µm
-
-
-
Mechanical
characteristic
3-point
bending strength
MPa
400
400
400
Young's
modulus
GPa
400
400
400
Vickers
hardness
GPa
-
-
-
Breakdown
Strength
kV/mm
-
-
-
Thermal
characteristic
Coefficient
of thermal expansion
40-400℃
×10-6/K
3.9
3.9
3.9
40-800℃
×10-6/K
4.3
4.3
4.3
Thermal
conductivity
25℃
W/(m・K)
130
130
130
Specific
heat
J/(kg・K)
-
-
-
Electric
characteristic
Dielectric constant
1MHz
-
-
-
-
Dielectric
Loss
1MHz
×10-4
-
-
-
Volume
resistivity
25℃
Ω・cm
>3x108
>3x108
>3x108
×
E-Churk 規格表
(表格內容可透過左右拖移
)
Items
Normal
Temp. Sputtering
High
Temp. Sputtering
HCAT
Japanese
Manufacturers
USA
Manufacturers
TSV
Specification
Susceptor
material
Aluminum
Ceramics
Ceramics
Dimension
(mm)
Ø330*9
Ø330*9
Ø330*9
Input
Voltage(kV)
+/- 3
+/- 3
+/- 3
Operating
Temp.(℃)
25~80
150~350
50~350
Dielectric
Insulation (GΩ),RT
>1
>1
>1.2
Life-Time(hr)
>1000
>2000
>2000
Breakdown
voltage (KV/mm)
10
25
25
Cart
0
Login
Notes
TOP